Equipment
Available at CeRTEV:
- DIGITAL LOW SPEED DIAMOND SAW MTI SYJ-150
- ICE POINT CALIBRATION REFERENCE CHAMBER AND TEMPERATURE REFERENCES PROBE, HIGH PRECISION BASE OMEGA TRCIII
- SIMULTANEOUS THERMAL ANALYZER (TG-DSC/DTA APPARATUS) STA 449 F3 JUPITER NETZSCH
- QUANTACHROME POROMETER 3G ZH
- MAGNETIC FORCE MICROSCOPE AND ANTI-VIBRATION TABLE TO USE WITH AFM AND RAMAN ABOVE
- UNIVERSAL TESTING MACHINE MTS C43.104
- OPTICAL EXTENSOMETER MTS FVX TO USE WITH THE TESTING MACHINE ABOVE
- ACCESSORIES FOR BENDING AND COMPRESSION TESTING TO USE WITH THE MTS TESTING MACHINE ABOVE
- LEICA DCM 3D CONFOCAL OPTICAL MICROSCOPE
- GLOVEBOX SYSTEM WITH GAS PURIFIER AND HUMIDITY CONTROL UNILAB 1200/780 MBRAUN
- DT-31-RS12-AE GLASS MELTING FURNACE WITH ATMOSPHERE ENVELOPE
- ATCP SONELASTIC PC BASED 90 KHZ
- MECHANICAL LATHE VEKER TVK-1840 ECO
- MICROTUBE GLOVE BOX FOR PURIFICATION OF RAW-MATERIALS AND SYNTHESIS OF OPTICAL GLASSES
- SUCTION SYSTEM FOR PREPARATION OF OPTICAL PREFORMS TO USE WITH GLOVE BOX ABOVE
- ACCESSORIES FOR INFRARED AND FAST RESPONSE DETECTION, PLUS INTEGRATING SPHERE FOR QUANTUM YIELD TO USE WITH
- FRITSH DISC MILL PULVERISETTE 13 WITH ZRO2 DISCS AND POLIMER COATING
- VACUUM CLEANER CATALOGUE NUMBER 43.9050.00, 230 VAC, 50/60 Hz, 1000 Watt TO USE WITH DISC MILL ABOVE
- PERKIN ELMER PYRIS 1THERMOGRAVIMETRIC ANALYZER (TGA) WITH CLARUS 680 GAS CHROMATOGRAPHY (GC) ANDCLARUS 600T MS MASS
- NETZSCH LABORATORY AGITATORMILL MINICER
- UPGRADE SYSTEM WITH AGILENTMODULE FOR SPINNING CONTROL, A MAS PROBE, A TUNING EXPANSION FOR NMR OF LOWGAMMA NUCLEI AND THE
- LABRAM HR VISIBLE - NIRRAMAN SPECTROMETER HORIBA JOBIN YVON
- AUTOMATIC PHYSIOSORPTIONANALYSER MODEL ASAP 2020N FROM MICROMERITICS
- NIKON ECLIPSE LV-100DCFI-LU POLARIZING OPTICAL MICROSCOPE FOR REFLECTED AND TRANSMITED LIGHT WITHDIGITAL CAMERA
- LONG DISTANCE OBJECTIVE SETTO USE WITH OPTICAL MICROSCOPE ABOVE
- SHIMADZU SEMI ANALYTICALSCALE UW4200H O.O1 G X 6200 G
- DISPERSION ACOUSTIC &ELECTROACOUSTIC SPECTROMETER DT-1200
- DELTECH DT-31-RS-1816 1700°C BOTTOM LOADING LABORATORY FURNACE
- DELTECH PROGRAMMABLEPNEUMATICALLY DRIVEN STIRRING MECHANISM TO USE WITH FURNACE ABOVE
- NABERTHERM LHT 16/17 LBRHIGH TEMPERATURE LIFT BOTTOM FURNACE FOR GLASS MELTING WITH PROTECTIVE GASFLUX
- UV/VIS/NIRSPECTROPHOTOMETER LAMBDA 1050 PBS URA SYSTEM US WITH PC
- PRECISION CNCDICING/CUTTING SAW MTI SYJ-800 WITH DIGITAL CONTROLLER
- MTI DESK TOP HIGH SPEEDVIBRATION BALL MILL MSK-SFM-3
- NOVOCONTROL ALPHA-ATBIMPEDANCE ANALYSER
- VACUUM DESICCATOR MARCONIMA192
- BUEHLER ECOMET 300/AUTOMET300 GRINDER/POLISHING MACHINE
- BUEHLER BURST DISPENSINGSYSTEM TO USE WITH GRINDER/POLISHING MACHINE ABOVE
- NABERTHERM LHT 16/17 LBRHIGH-TEMPERATURE LIFT BOTTOM FURNACE FOR GLASS MELTING
- SOLID-STATE NUCLEARMAGNETIC RESONANCE SPECTROMETER WITH PULSED FIELD GRADIENT UNIT 500 MHZ WBSOLIDS SYSTEM AGILENT
- AVURE CIP 32260 COLDISOSTATIC PRESS
- SHIMADZU SEMI ANALYTICALSCALE AUW-D O.O001 G X 82/220 G
- PFG UNIT FOR DIFFUSION -HIGH FIELD, TO USE WITH 500 MHZ WB SOLIDS SYSTEM NMR (ITEM 2, YEAR 1)
- PRESI CUTTING MACHINEMECATOME T180
- GLOVEBOX SYSTEM WITH GASPURIFIER AND HUMIDITY CONTROL UNILAB 1200/780 MBRAUN
- BUCHI MINI SPRAY DRYERB-290 ADVANCED
- BUCHI INERT LOOP B-295 TOUSE WITH SPRAY DRYER ABOVE
- MICROMETRIC MOTORISED ZSTAGE AND AUTOFOCUS DEVICE FOR MTORIZED Z ITEM TO USE WITH RAMAN SPECTROMETERABOVE
- IVOCLAR FURNACE PROGRAMATEP 5000
- MICROHARDNESS AUTOMATICTESTING MACHINE UHL VMH-I04
- SPECTROFLUORIMETERFLUOROLOG 3 HORIBA JOBIN YVON
- ZEISS POLARIZING OPTICALMICROSCOPE AXIO IMAGER.A2M FOR REFLETING AND TRANSMITING LIGHT WITH DIC
- ZEISS LONG-DISTANCE WORKOBJETIVES 20X, 50X AND 100X TO USE WITH THE MICROSCOPE ABOVE
- CARBOLITE MRF16/22 CMATMICROWAVE FURNACE
- ATOM FORCE MICROSCOPE PARKXE-100 TO USE WITH THE RAMAN SPECTROMETER ABOVE
Available at LaMaV:
- 3 Botton load furnaces (up to 1750 ºC)
- 1 Sintering furnace (up to 1750 ºC)
- 1 Melting furnace (up to 1600 ºC)
- Platinum and ceramic (ZAS, Alumina) crucibles
- Several molds and working tools
- 13 Heat treatment furnaces (up to 1100 ºC)
- Glass cutting and polishing equipment
- 2 Abbe refractometers
- 1 Fourier transform infrared spectrometer (FTIR)
- 1 UV-VIS spectrometer
- 1 Dilatometer (1375 ºC)
- 6 Optical microscopes
- 1 Optical bench with microhardness tester
- 1 Viscometer for: 2 < Log (viscosity) < 5 [Pas] (1600 ºC)
- 2 Viscometer for: 6 < Log (viscosity) < 12 [Pas] (1050 ºC)
- X-ray diffractometer
- 1 Dynamic mechanical thermal analyzer, DMTA (800 ºC)
- 2 Hot stage microscopes (1500 ºC)
- 1 Complex impedance analyzer
- 1 Differential scanning calorimeter (1500 ºC)
- 1 Density Comparator AGR
- 1 Helium picnometer
- 1 Metler Toledo balance with density determination kit
We also have a special agreement with the Materials Characterization & Development Center (CCDM) which has the following state-of-art equipment:
- Fourier transform infrared spectrometer (FTIR)
- D 5000 X-ray diffraction system
- 400 MHz Nuclear Magnetic Resonance (NMR)
- Inductively coupled plasma system (ICP)
- Thermal analyzer system (TGA-DTA-DSC)
- Helium picnometer
- Image analyzer system
- Scanning electron microscope (SEM)
- Surface spectromicroscope with XPS, AES, SAM and ISS
Laboratory of Structural Characterization - DEMa / UFSCar
- Scanning Electron Microscopy - SEM http://www.lce.dema.ufscar.br/varredura.html
- Transmission Electron Microscopy - TEM http://www.lce.dema.ufscar.br/transmissao.html
- Atomic Force Microscopy http://www.lce.dema.ufscar.br/forcaatomica.html
- X-Ray Diffraction http://www.lce.dema.ufscar.br/difracaorx.html
- Optical Microscopy with Image Analyzer
- Sample Preparation http://www.lce.dema.ufscar.br/preparacaoamostras.html